AA2000 Atomic Force Microscope (AFM)
VIEW MORE+AA2000 Atomic Force Microscope (AFM)
VIEW MORE+AA3000 Scanning Probe Microscope(SPM)
VIEW MORE+AA5000 Multi-function Scanning Probe Microscope(SPM) Systems
VIEW MORE+AA5000 Multi-function Scanning Probe Microscope(SPM) Systems
VIEW MORE+Inquiry and Sales: sales@angstrom-advanced.com or Online Request
Functions | Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM) |
Resolution | AFM: 0.26nm lateral, 0.1nm vertical |
Technical Parameters |
X-Y scan scope: ~ 10 micrometer
Z distance: ~ 2 micrometer Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024 Scan Angle: 0 ~ 360° Scan Rate: 0.1 ~ 100 Hz |
Electronics |
CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments
Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet |
Mechanics |
Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000, and reach
30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm |
Software | Online Control Software and offline Image Processing Software |