AA2000 Atomic Force Microscope (AFM)
VIEW MORE+AA2000 Atomic Force Microscope (AFM)
VIEW MORE+AA3000 Scanning Probe Microscope(SPM)
VIEW MORE+AA5000 Multi-function Scanning Probe Microscope(SPM) Systems
VIEW MORE+OS-AA Opening Multi-function Scanning Probe Microscope(SPM)
VIEW MORE+Inquiry and Sales: sales@angstrom-advanced.com or Online Request
AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.
Functions | Atomic Force Microscope (AFM)
Scanning Tunneling Microscope(STM) Lateral Force Microscope (LFM) |
Resolution | AFM: 0.26nm lateral, 0.1nm vertical
Scanning Tunneling Microscope(STM) |
Technical Parameters |
X-Y scan scope: ~ 10 micrometer
Z distance: ~ 2 micrometer Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024 Scan Angle: 0 ~ 360° Scan Rate: 0.1 ~ 100Hz |
Electronics |
CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments
Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet |
Mechanics |
Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach
30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm |
Software | Online Control Software and offline Image Processing Software |