ADX-2500 X-ray Diffraction (XRD) is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 XRD is a diffraction system according to the practical requirements in many fields.

ADX-2500 X-ray Diffractometer provides the structure analysis of single crystal, polycrystalline and amorphous sample. ADX-2500 X Ray Diffraction is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.

• Perfect incorporation of the hardware and software, allows ADX-2500 X-ray Diffraction to perform different types of analysis for researchers from various fields;
• High precision of the diffraction angle measurement allows ADX-2500 X-ray Diffraction to obtain the more accurate data;
• Higher stability of the X-ray generator control system provides excellent measurement accuracy;
• Simple and effective design makes ADX-2500 XRD convenient for operation and user friendly.

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of X-ray Diffraction(XRD) pattern.

• Profile fitting and overlapped peeks separation

With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain.

• Qualitative Analysis

The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.

• Quantitative Analysis

After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).

• Plot and Export

The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.

X-ray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	4 kW
	Tube voltage	10 ~ 60 kV
	Tube current	5 ~ 80 mA
	X-ray tube	Cu, Fe, Co, Cr, Mo et al (2.4 kW) Focus dimension: 1mm × 10mm2 or 0.4mm ×10 mm2
	Stability	≤ 0.01%

Goniometer	Goniometer	thetaθ/thetaθ
	Diffraction circle semi-diameter	225mm
	Scan range of 2θ	-6° ~ 160°
	Continuous scanning rate	0.06° ~ 50°/min
	Setting speed of angle	1500°/min
	Scan mode	θ-2θ linkage, θ,2θ one way: continuous or step scanning
	One way repeatability of 2θ	≤ 0.001°
	Minimal stepping angle	0.001°
	Precision of 2θ	≤ 0.02°

Record Unit	Counter	PC or SC
	Maximal CPS	5×106 CPS
	Proportion counter energy spectrum resolution	≤ 25%(PC), ≤ 55%(SC)
	Detectable high voltage	1500-2100 V continuous tune
	High voltage of the counter	differential or integral, automatic PHA, dead time emendation
	System detector stability	≤ 0.01%

Integrated performance	Dispersion dosage	≤ 1μSv/h
	Integrated stability of the system	≤ 0.5%
	Dimension	1000mm × 800mm × 1600mm